AT27LV040A(2011) View Datasheet(PDF) - Atmel Corporation

Part Name

Description

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AT27LV040A
(Rev.:2011)

4Mb (512K x 8) Low Voltage, One-time Programmable, Read-only Memory

Atmel Corporation 

Figure 5-1. AC waveforms for read operation(1)

Atmel AT27LV040A

Notes:

1. Timing measurement references are 0.8V and 2.0V. Input AC drive levels are 0.45V and 2.4V. See input test waveforms

and measurement levels.

2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE.

3. OE may be delayed up to tACC - tOE after the address is valid without impact on tACC.

4. This parameter is only sampled, and is not 100% tested.

5. Output float is defined as the point when data is no longer driven.

Figure 5-2. Input test waveforms and measurement level

tR, tF < 20 ns (10% to 90%)

Figure 5-3. Output test load

Note: CL = 100pF including

jig capacitance.

5

0557E–EPROM–4/11

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