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AT27C4096 View Datasheet(PDF) - Atmel Corporation

Part Name
Description
View to exact match
AT27C4096
Atmel
Atmel Corporation Atmel
AT27C4096 Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
AC Waveforms for Read Operation(1)
AT27C4096
Notes: 1. Timing measurement references are 0.8V and 2.0V. Input AC drive levels are 0.45V and 2.4V, unless otherwise specified.
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE.
3. OE may be delayed up to tACC - tOE after the address is valid without impact on tACC.
4. This parameter is only sampled and is not 100% tested.
5. Output float is defined as the point when data is no longer driven.
Input Test Waveforms and Measurement Levels
For -55 devices only:
Output Test Load
tR, tF < 5 ns (10% to 90%)
For -70, -90, -12 and -15 devices:
Note:
CL = 100 pF including jig
capacitance, except for
the -45 and -55 devices,
where CL = 30 pF.
tR, tF < 20 ns (10% to 90%)
Pin Capacitance
(f = 1 MHz T = 25°C)(1)
Typ
Max
Units
Conditions
CIN
4
10
pF
VIN = 0V
COUT
8
12
pF
VOUT = 0V
Note: 1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100% tested.
5

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