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10XSC425 View Datasheet(PDF) - Freescale Semiconductor

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10XSC425 Datasheet PDF : 56 Pages
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Table 4. Static Electrical Characteristics (continued)
Characteristics noted under conditions 6.0 V VPWR 20 V, 3.0 V VDD 5.5 V, -40 C TA 125 C, GND = 0 V, unless
otherwise noted. Typical values noted reflect the approximate parameter means at TA = 25 °C under nominal conditions, unless
otherwise noted.
Symbol
Characteristic
Min
Typ
Max
Unit Notes
OUTPUTS HS0 TO HS3 (CONTINUED)
CSR0_0_ACC
(CAL)
HS[0,1] Current Recopy Accuracy with one calibration point
(6.0 V < VHS[0:1] < 20 V) with 28W bit = 0
• IHS[0:1] = 5.0 A
%
(16)
-5.0
5.0
(CSR0_0)/
(T)
HS[0,1] CSR0 Current Recopy Temperature Drift (6.0 V < VHS[0:1] < 20 V)
with 28W bit = 0
• IHS[0:1] =5.0 A
%/C (17)
0.04
CSR0_1_ACC
HS[0,1] Current Sense Ratio (CSR0) Accuracy (6.0 V < VHS[0:1 < 20 V)
with 28W bit = 1
%
At 25 C and 125 C
• IHS[0:1] = 3.0 A
-22
22
• IHS[0:1] = 1.5 A
-25
25
At -40 C
• IHS[0:1] = 3.0 A
• IHS[0:1] = 1.5 A
-30
30
-35
35
CSR0_1_ACC
(CAL)
HS[0,1] Current Recopy Accuracy with one calibration point
(6.0 V < VHS[0:1] < 20 V) with 28W bit = 1
• IHS[0:1] = 3.0 A
%
(16)
-5.0
5.0
CSR1_0_ACC
HS[0,1] Current Sense Ratio (CSR1) Accuracy (6.0 V < VHS[0:1] < 20 V)
with 28W bit = 0
%
At 25 C and 125 C
• IHS[0:1] = 12.5 A
• IHS[0:1] = 75A
-20
20
-18
18
At -40 C
• IHS[0:1] = 12.5 A
-30
30
• IHS[0:1] = 75 A
-25
25
CSR1_0_ACC
(CAL)
HS[0,1] Current Recopy Accuracy with one calibration point
(6.0 V < VHS[0:1] < 20 V) with 28W bit = 0
• IHS[0:1] = 12.5 A
%
(16)
-5.0
5.0
CSR1_1_ACC
HS[0,1] Current Sense Ratio (CSR1) Accuracy (6.0 V < VHS[0:1] < 20 V)
with 28W bit = 1
%
At 25 C and 125 C
• IHS[0:1] = 12.5 A
• IHS[0:1] = 37.5 A
-22
22
-20
20
at -40 C
• IHS[0:1] = 12.5 A
-27
27
• IHS[0:1] = 37.5 A
-25
25
CSR1_1_ACC
(CAL)
HS[0,1] Current Recopy Accuracy with one calibration point
(6.0 V < VHS[0:1] < 20 V) with 28W bit = 1
• IHS[0:1] = 12.5 A
%
(16)
-5.0
5.0
Notes
16. Based on statistical analysis. It is not production tested.
17. Based on statistical data: delta (CSR0)/delta (T) = {(measured ICSNS at T1 - measured ICSNS at T2) / measured ICSNS at room} / {T1-T2}.
Not production tested.
10XSC425
14
Analog Integrated Circuit Device Data
Freescale Semiconductor

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